17O Hysteresis Sputtering Defects Topological insulators Adsorption Low energy electron diffraction LEED Ageing Auger electron spectroscopy AES Multilayer 18O Indium oxide 8140Ef 27Ald p&α Thin film Alloy Aluminum 15N 6855Jk 17Op Adsorbed layers Pb centers Oxygen deficiency Magnetization curves RBS Density functional theory Channeling Nanostructures 3C-SiC AFM Epitaxy Kossel diffraction Energy loss Topological defects Nickel ADSORPTION DESORPTION HYSTERESIS Silicon carbide Measurement Pulsed laser deposition Ion implantation Transparent conductive oxide TCO 7630Lh XRD SiC NRP Aluminium Acoustic ALD Adsorption Isotherms Capillary condensation 17Opp Photoluminescence Ferromagnetic resonance Oxidation Annealing Ion beam analysis Magnetic semiconductors Raman spectroscopy Thin films HfO2 XPS Zinc oxide Silica Silicon Carbide X-ray diffraction 13C Evaluation 27Aldp Acoustic propreties of solid EPR Magnetic anisotropy Gallium oxide Rutherford backscattering spectrometry RBS PIXE Diffusion Interface defects Stable isotopic tracing Isotopic Tracing Nanoparticles GaMnAs Al2O3 27Alda Charge exchange Silicon AC susceptibility Gold Epitaxial growth Alloys Nuclear resonance profiling NRP 7550Ee Passivation Nuclear reaction analysis 7550Pp Growth Periodic multilayer Nitridation Metal-insulator transition 2H Atomic Layer Deposition ALD 18O resonance