8140Ef Transparent conductive oxide TCO 17Op Silicon carbide Topological insulators Pb centers AC susceptibility Growth Magnetization curves PIXE 13C Nitridation Measurement Atomic Layer Deposition ALD Aluminum Diffusion ADSORPTION DESORPTION HYSTERESIS Stable isotopic tracing Magnetic anisotropy Raman spectroscopy Silica Silicon Ion implantation Nickel Thin film Channeling Isotopic Tracing 18O Pulsed laser deposition NRP Gallium oxide Multilayer 7550Pp NRA 27Alda Passivation Nanoparticles XRD 18O resonance Nuclear resonance profiling NRP Low energy electron diffraction LEED Charge exchange Nanostructures Hysteresis Ion beam analysis Periodic multilayer Ageing EPR Evaluation 6855Jk Gold 3C-SiC 17O Acoustic Adsorption Isotherms Interface defects Epitaxial growth Silicon Carbide Epitaxy Rutherford backscattering spectrometry RBS Magnetic semiconductors AFM Oxidation Aluminium Density functional theory X-ray diffraction Auger electron spectroscopy AES Indium oxide GaMnAs Oxygen deficiency Photoluminescence ALD SiC 17Opp Zinc oxide Acoustic propreties of solid Capillary condensation Adsorbed layers Energy loss RBS Ferromagnetic resonance Nuclear reaction analysis Alloys 7550Ee Sputtering Annealing 15N 7630Lh Adsorption Kossel diffraction 2H Thin films 27Ald p&α Topological defects 27Aldp XPS Metal-insulator transition Defects HfO2 Al2O3