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Analyse de défaillance de nouvelles technologies microélectroniques : nouvelles approches dans la méthodologie de préparation d'échantillon

Abstract : In the development of microelectronic technologies, the failure analysis makes it possible to define corrective actions thanks to the understanding of the failure mechanism. In order to define the most adequate localization and observation techniques to use, a failure analysis flow is required. The sample preparation is a key step of this flow. This flow must continuously evolve to take into account the technological innovations that introduce new materials, and increase the complexity of assembled components. This work concerned the sample preparation flow for the failure analysis of two product families : the discrete products and IPAD, and the micro-batteries. Concerning the discrete products and the IPAD, an optimization of the current flow was performed with the integration of new approaches developed to solve failed cases. For the micro-batteries, the used materials and their architecture required an entire reappraisal of the sample preparation flow.
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https://theses.hal.science/tel-00990863
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Submitted on : Wednesday, May 14, 2014 - 12:06:05 PM
Last modification on : Monday, October 19, 2020 - 11:02:30 AM
Long-term archiving on: : Thursday, August 14, 2014 - 11:35:11 AM

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  • HAL Id : tel-00990863, version 1

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A. Aubert. Analyse de défaillance de nouvelles technologies microélectroniques : nouvelles approches dans la méthodologie de préparation d'échantillon. Electronique. Université Sciences et Technologies - Bordeaux I, 2012. Français. ⟨NNT : ⟩. ⟨tel-00990863⟩

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