.. Etude-de-la-section-efficace-par-laser, 121 III.6.5. Etude profil Seuil SEL en fonction de la profondeur de focalisation, p.126

.. Etude-du-seuil-de-déclenchement-laser and .. Au-laser, 142 IV.5.2. Cartographie de la sensibilité Étude du seuil laser en fonction de la fréquence d'irradiation laser, Conclusion, p.148

. Références-] and V. Pouget, Scanning laser ultrasonics experiments for in situ nondestructive analysis of integrated circuits, Device and Materials Reliability IEEE Transactions on, vol.5, issue.3, pp.564-571, 2005.

D. Lewis, Backside SC-OBIC using a pulsed NIR-laser and its application to fault location. In Physical and Failure Analysis of Integrated Circuits, Proceedings of the 9th International Symposium on the. Physical and Failure Analysis of Integrated Circuits Proceedings of the 9th International Symposium on the. IEEE, pp.193-195, 2002.

G. Imbert, Current leakage fault localization using backside OBIRCH. In Physical and Failure Analysis of Integrated Circuits, Proceedings of the 2001 8th International Symposium on the. Physical and Failure Analysis of Integrated Circuits Proceedings of the 2001 8th International Symposium on the, pp.121-125, 2001.

K. Hempel, Application of the time-resolved optical-beaminduced current method to the investigation of n-metal-oxide-semiconductor inverters, Journal of Applied Physics, p.713010, 1992.

E. Lorfevre, CARMEN/MEX test board for the study of radiation effects on electronic components aboard JASON-2 and SAC-D satellites, 9th European Conference on Radiation and Its Effects on Components and Systems 9th European Conference on Radiation and Its Effects on Components and Systems, pp.1-6, 2007.

D. Mcmorrow, Single-event transient (SET) characterization of an LM119 voltage comparator: an approach to SET model validation using a pulsed laser, IEEE Transactions on Nuclear Science, vol.49, issue.3, pp.1502-1508, 2002.

A. M. Chugg, Laser SEL sensitivity mapping of SRAM cells, European Conference on Radiation and Its Effects on Components and Systems (RADECS). 2009 European Conference on Radiation and Its Effects on Components and Systems (RADECS). IEEE, pp.324-328, 2009.

C. Jr and P. Tangyunyong, TIVA and SEI developments for enhanced front and backside interconnection failure analysis. Microelectronics Reliability, pp.6-7991, 1999.

H. Lapuyade, Backside SEU laser testing for commercial offthe-shelf SRAMs, IEEE Transactions on Nuclear Science, vol.49, issue.6, pp.2977-2983, 2002.

K. Sanchez, Full Dynamic Laser simulation set up, Physical and Failure Analysis of Integrated Circuits 16th IEEE International Symposium on the, pp.213-217, 2009.
URL : https://hal.archives-ouvertes.fr/hal-00988356

S. Ee-leong-alam, Highly efficient, high power, inbandpumped Erbium/Ytterbium-codoped fiber laser, 2011 Conference on Lasers and Electro-Optics (CLEO). 2011 Conference on Lasers and Electro-Optics, 2011.

F. Beaudoin, Impact of semiconductors material on IR stimulation signal, Proceedings of the European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF), pp.1465-1470, 2005.
URL : https://hal.archives-ouvertes.fr/hal-00401389

Y. Mashiko, New non-bias optical beam induced current (NB-OBIC) technique for evaluation of Al interconnects, Reliability Physics Symposium, 1995. 33rd Annual Proceedings., IEEE International. Reliability Physics Symposium, 1995. 33rd Annual Proceedings., IEEE International. IEEE, pp.228-233, 1995.

G. Haller, Scan-based ATPG diagnostic and optical techniques combination: A new approach to improve accuracy of defect isolation in functional logic failure, IEEE, pp.1-5, 2008.
URL : https://hal.archives-ouvertes.fr/hal-00398000

S. Buchner, Laser-Induced Latchup Screening and Mitigation in CMOS Devices, Nuclear Science IEEE Transactions on, vol.53, issue.4, pp.1819-1824, 2006.

N. Buard, Laser Mapping of SRAM Sensitive Cells: A Way to Obtain Input Parameters for DASIE Calculation Code, IEEE Transactions on Nuclear Science, vol.53, issue.4, pp.1863-1870, 2006.
URL : https://hal.archives-ouvertes.fr/hal-00206425

W. Dawes, Latch-Up Control in CMOS Integrated Circuits, IEEE Transactions on Nuclear Science, vol.26, issue.6, pp.5065-5068, 1979.

R. Desplats, Identification of some key parameters for photoelectric laser stimulation of IC: an experimental approach. In Physical and Failure Analysis of Integrated Circuits, IPFA 2005. Proceedings of the 12th International Symposium on the. Physical and Failure Analysis of Integrated Circuits, 2005. IPFA 2005. Proceedings of the 12th International Symposium on the. IEEE, pp.21-26, 2005.

J. T. Blandford, Cosmic Ray Induced in MOS Memory Cells, IEEE Transactions on Nuclear Science, vol.25, issue.6, pp.1166-1171, 1978.

R. Deplats, Delay variation mapping induced by dynamic laser stimulation, Reliability Physics Symposium, 2005. Proceedings. 43rd Annual. 2005 IEEE International. Reliability Physics Symposium, 2005. Proceedings. 43rd Annual. 2005 IEEE International. IEEE, pp.305-311, 2005.

P. F. Byrne, A new method for preventing CMOS latch-up, Electron Devices Meeting, pp.406-409, 1984.

F. Bezerra, Probing SET Sensitive Volumes in Linear Devices Using Focused Laser Beam at Different Wavelengths, IEEE Transactions on Nuclear Science, vol.55, issue.4, pp.2007-2012, 2008.

C. Scientifique, E. Faraud, V. Pouget, K. Shao, C. Larue et al., Investigation on the SEL Sensitive Depth of an SRAM Using Linear and Two-Photon Absorption Laser Testing, NSREC Nuclear Science IEEE TNS, issue.6, pp.582637-2643, 2011.

V. Pouget, E. Faraud, K. Shao, S. Jonathas, and D. Lewis, Picosecond Single-Photon and Femtosecond Two-Photon Pulsed Laser Stimulation, ISTFA 2009, International Symposium for Testing and Failure Analysis
URL : https://hal.archives-ouvertes.fr/hal-00670060

K. Shao, A. Morisset, V. Pouget, E. Faraud, C. Larue et al., 3D knife-edge characterization of two-photon absorption volume in silicon for integrated circuit testing, Optics Express, vol.19, issue.23, 2011.
URL : https://hal.archives-ouvertes.fr/hal-00667432

K. Shao, V. Pouget, E. Faraud, C. Larue, and D. Lewis, Comparison of classical and twophoton photoelectric laser stimulation capabilities for failure analysis, Physical and Failure Analysis of Integrated Circuits (IPFA) 18th IEEE International Symposium on the failure analysis, 2011.
URL : https://hal.archives-ouvertes.fr/hal-00669828