Reliability of Analog-to-Digital Sigma-Delta Converters
Fiabilisation de Convertisseurs Analogique-Num´erique a Modulation Sigma-Delta
Résumé
Due to the continuously scaling down of CMOS technology, system-on-chips (SoCs) reliability becomes important in sub-90 nm CMOS node. Integrated circuits and systems applied to aerospace, avionic, vehicle transport and biomedicine are highly sensitive to reliability problems such as ageing mechanisms and parametric process variations. Novel SoCs with new materials and architectures of high complexity further aggravate reliability as a critical aspect of process integration. For instance, random and systematic defects as well as parametric process variations have a large influence on quality and yield of the manufactured ICs, right after production. During ICs usage time, time-dependent ageing mechanisms such as negative bias temperature instability (NBTI) and hot carrier injection (HCI) can significantly degrade ICs performance.
La fiabilit´e des ICs est d´efinie ainsi : la capacit´e d’un circuit ou un syst`eme int´egr´e `a
maintenir ses param`etres durant une p´eriode donn´ee sous des conditions d´efinies. Les rapports
ITRS 2011 consid`ere la fiabilit´e comme un aspect critique du processus d’int´egration.
Par cons´equent, il faut faire appel des m´ethodologies innovatrices prenant en compte
la fiabilit´e afin d’assurer la fonctionnalit´e du SoCs et la fiabilit´e dans les technologies
CMOS `a l’´echelle nanom´etrique. Cela nous permettra de d´evelopper des m´ethodologies
ind´ependantes du design et de la technologie CMOS, en revanche, sp´ecialis´ees en fiabilit´e.
Domaines
Electronique
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